Scanning electron microscopy assisted by EDS
Microstructural characterization of materials, namely:
- Microscopy analysis with magnification up to 50 000x
- Local chemical analysis by EDS (Energy Dispersive Spectroscopy)
- 3D topography including roughness measurements
Crystallographic characterization by X-ray diffraction
Crystallographic characterization of materials, namely:
- Crystallographic phase identification;
- Rietveld refinements
- Lattice parameters determination
- Quantitative mineralogical analysis
- Determination of amorphous phase content
The facilities include room and high-temperature X-ray diffraction measurements..
