Scanning electron microscopy assisted by EDS

Microstructural characterization of materials, namely:

  • Microscopy analysis with magnification up to 50 000x
  • Local chemical analysis by EDS (Energy Dispersive Spectroscopy)
  • 3D topography including roughness measurements

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Crystallographic characterization by X-ray diffraction

Crystallographic characterization of materials, namely:

  • Crystallographic phase identification;
  • Rietveld refinements
  • Lattice parameters determination
  • Quantitative mineralogical analysis
  • Determination of amorphous phase content

The facilities include room and high-temperature X-ray diffraction measurements..

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