Laboratório dedicado à análise estrutural e microestrutural de materiais. Os equipamentos relevantes são um microscópio electrónico de varrimento (SEM) dotado com análise elementar por espectroscopia de dispersão de energia (EDS) e um difractómetro de raios X.

Contact: João C.C. Abrantes

Optical Microscopy with Digital Image Analysis

Nikon

Scanning Electron Microscopy

Hitachi - SU1510

Energy-Dispersive X-ray Spectroscopy (with SEM equipment)

Bruker - Quantax 200

Carbon Coater

Quorum - Q150R E

X-Ray Difractometer (with high temperature chamber)

Bruker - D8 Advance DaVinci

FTIR Spectrometer

Shimadzu - IRAffinity-1S

UV SEM Sample Cleaning

Hitachi ZONE II

Structure and microstructure charactarization of materials

Microstructural characterization of materials, namely:

  • Microscopy analysis with magnification up to 50 000x
  • Local chemical analysis by EDS (Energy Dispersive Spectroscopy)
  • 3D topography including roughness measurements
Crystallographic X-ray Diffraction characterization of materials, namely:
  • Crystallographic phase identification;
  • Rietveld refinements;
  • Lattice parameters determination;
  • Quantitative mineralogical analysis;
  • Determination of amorphous phase content;
The facilities include room and high-temperature X-ray diffraction measurements.


Fourier Transform Infrared Spectroscopy (FTIR), providing a chemical characterization of materials namely:
  • Chemical analysis by Identification and quantification of chemical compounds in organic and inorganic substances, including polymers, pharmaceuticals, and chemicals;
  • Complementary information in studying the composition, structure, and bonding of materials, within the classes of polymers, ceramics, composites, and thin films.